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Free, publicly-accessible full text available July 14, 2026
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Aguirre, L; Groh, B; Lee, K; Venkatesan, S; Connolly, L; Baldea, M; Chang, C; Cullinan, M (, American Society for Precision Engineering)Free, publicly-accessible full text available November 7, 2025
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Groh, B; Lee, K; Venkatesan, S; Aguirre, L; Frey, S; Connolly, L; Baldea, M; Chang, C; Cullinan, M (, Frontiers of Characterization and Metrology for Nanoelectronics)
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Groh, B; Lee, K; Connolly, L; Frey, S; Grady, A; Cullinan, M; Chang, C (, ASPE)
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